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MS-6: RGA User Group Meeting

19 June 2024 | Harrogate Convention Centre
Queen’s Suite – Cockcroft Room

Session 1: WePS1e: MS-6
Chair | Joe Herbert, Klaus Bergner
   
10:30 Opening Comments
Joe Herbert – ASTeC, STFC Daresbury Laboratory
Announcement & Award of 2024 Harry Leck Memorial Medal
by Richard Pilkington & Robin Hathaway, Vacuum Symposium Committee
   
10:40 RGA Using a Membrane Inlet
Prof Steve Taylor, University of Liverpool & Robin Hathaway, SS Scientific Ltd
   
11:00 Quadrupole Residual Gas Analysis Developments at TNO
René Koops, TNO, Netherlands
   
11:15 RGA vs. Leak Detector – When to use an RGA?
Cliff Harris, Inficon, UK
   
11:30 Carrier gas in helium leak detection – application to conductance-limited devices
Laurent Ducimetiere, Pfeiffer Vacuum
   
11:45 Residual gas analysers (RGAs) on the Diamond Light Source
Hugo Shiers, Diamond Light Source, UK
   
12:00 Traceable partial pressure and leak rate measurements applying ISO/TS 20176
Matthias Bernien, PTB Berlin
   
12:20 Harry Leck Memorial Medal Winner Talk
Professor Dave Armour, University of Salford (retired)
   
12:30 Lunch / Exhibition
   
Session 2: WePS2e: VST
Chair | Steve Taylor, Matthias Bernien
   
14:00 Remote RGA operation up to 100m, with a novel radiation resistant extender cable
Farnoush Salarzaei, MKS Instruments
   
14:30 Correlation of mass spectrometry and pressure in ultra-high vacuum systems
Mareen Czech, University of Bremen, Germany
   
14:45 Unlocking the mysteries of process gases: Insights from Mass Spectrometry
Florian Heck & Laurent Ducimetiere, Pfeiffer Vacuum
   
15:00 Comparison of residual gas analyser calibration coefficients across high to extreme high vacuum
Eleni Marshall, STFC Daresbury, UK
   
15:15 Discussion (to 15:30)
   
Session 3: WePS3e: VST
Chair |  Dr Farnoush Salarzaei
   
16:00 A systematic approach for contamination control
Freek Molkenboer, TNO, Netherlands
   
16:15 Monitoring chamber health with an Optical Plasma Gauge
Martin Wuest, Inficon
   
16:30 Enabling vacuum process monitoring with time-of-flight spectroscopy
Kristian Kirsch, VACOM, Germany
   
16:45 Advancements in ultra-high sensitivity mass spectrometers for atom scattering
Nick von Jeinsen, University of Cambridge, UK
   
17:00 Mastering Clean Vacuum: overcoming contamination for science and industrial applications
Klaus Bergner, VACOM, Germany
   
17:15 Discussion (to 17:30)
   
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