MS-6: RGA User Group Meeting
19 June 2024 | Harrogate Convention Centre
Queen’s Suite – Cockcroft Room
VS13 2024
19 June 2024 | Harrogate Convention Centre
Queen’s Suite – Cockcroft Room
| Session 1: | WePS1e: MS-6 Chair | Joe Herbert, Klaus Bergner |
| 10:30 | Opening Comments Joe Herbert – ASTeC, STFC Daresbury Laboratory Announcement & Award of 2024 Harry Leck Memorial Medal by Richard Pilkington & Robin Hathaway, Vacuum Symposium Committee |
| 10:40 | RGA Using a Membrane Inlet Prof Steve Taylor, University of Liverpool & Robin Hathaway, SS Scientific Ltd |
| 11:00 | Quadrupole Residual Gas Analysis Developments at TNO René Koops, TNO, Netherlands |
| 11:15 | RGA vs. Leak Detector – When to use an RGA? Cliff Harris, Inficon, UK |
| 11:30 | Carrier gas in helium leak detection – application to conductance-limited devices Laurent Ducimetiere, Pfeiffer Vacuum |
| 11:45 | Residual gas analysers (RGAs) on the Diamond Light Source Hugo Shiers, Diamond Light Source, UK |
| 12:00 | Traceable partial pressure and leak rate measurements applying ISO/TS 20176 Matthias Bernien, PTB Berlin |
| 12:20 | Harry Leck Memorial Medal Winner Talk Professor Dave Armour, University of Salford (retired) |
| 12:30 | Lunch / Exhibition |
| Session 2: | WePS2e: VST Chair | Steve Taylor, Matthias Bernien |
| 14:00 | Remote RGA operation up to 100m, with a novel radiation resistant extender cable Farnoush Salarzaei, MKS Instruments |
| 14:30 | Correlation of mass spectrometry and pressure in ultra-high vacuum systems Mareen Czech, University of Bremen, Germany |
| 14:45 | Unlocking the mysteries of process gases: Insights from Mass Spectrometry Florian Heck & Laurent Ducimetiere, Pfeiffer Vacuum |
| 15:00 | Comparison of residual gas analyser calibration coefficients across high to extreme high vacuum Eleni Marshall, STFC Daresbury, UK |
| 15:15 | Discussion (to 15:30) |
| Session 3: | WePS3e: VST Chair | Dr Farnoush Salarzaei |
| 16:00 | A systematic approach for contamination control Freek Molkenboer, TNO, Netherlands |
| 16:15 | Monitoring chamber health with an Optical Plasma Gauge Martin Wuest, Inficon |
| 16:30 | Enabling vacuum process monitoring with time-of-flight spectroscopy Kristian Kirsch, VACOM, Germany |
| 16:45 | Advancements in ultra-high sensitivity mass spectrometers for atom scattering Nick von Jeinsen, University of Cambridge, UK |
| 17:00 | Mastering Clean Vacuum: overcoming contamination for science and industrial applications Klaus Bergner, VACOM, Germany |
| 17:15 | Discussion (to 17:30) |
| POSTER SESSIONS |