Surface Analysis – Innovations and Solutions for Industry

Programme

10:15
Welcome and Introduction: Mark Baker

Session 1:

10:20
KEYNOTE PRESENTATION
Bridging the pressure and complexity gap with near-ambient pressure XPS and electrospray deposition
Professor James O’Shea, University of Nottingham, UK

10:50
Near-Ambient Pressure XPS: From surfaces to interfaces
Dr Alex Walton, University of Manchester, UK

11:10
Surface phase analysis using XPS
Dr Robert Palgrave, University College London, UK

11:30
Break

11:50
Nexsa XPS/Raman multi-technique instrument
Paul Mack, Fisher Scientific

12:10
A Journey through the Sciences: A multidisciplinary approach to XPS in surface analysis
Dr Mark Walker, University of Warwick, UK

12:30
Poster Session, Exhibition and Lunch Break. A poster prize will be awarded at 13:30 for the best poster.

Session 2:

14:00
KEYNOTE PRESENTATION
3D OrbiSIMS and applications of SIMS for 2D Materials
Dr Barry Brennan, National Physical Laboratory, UK

14:30
XPS using hard x-rays for materials research
Dr Tien-Lin Lee, Diamond Light Source, UK

14:50
Energy, Images and Clusters: Advances in XPS for industrial applications
Dr David Morgan, Cardiff University, UK

15:10
Concluding comments

15:15
Close of meeting