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Surface Analysis – Innovations and Solutions for Industry

Programme

10:00
Welcome and Introduction: Mark Baker

Session 1: Chair: Dr Mark Baker

10:10
Standards in surface chemical analysis
Dr Alex Shard, National Physical Laboratory, UK

10:50
Surface analysis in the nuclear industry
Dr Paul Roussel, AWE, UK

11:10
Latest Developments in 2D and 3D TOF-SIMS Analysis
Matthias Kleine-Boymann, ION-TOF GmbH, Germany

11:30
Break

11:50
ToF-SIMS and industrial applications
Dr David Scurr, University of Nottingham, UK

12:10
XPS for surface and thin film characterisation
Dr Chris Blomfield, Kratos Analytical Ltd, UK

12:30
Poster Session, Exhibition and Lunch Break

Session 2: Chair: Alex Shard

14:10
KEYNOTE PRESENTATION
Near-ambient pressure instrumentation: New directions for Surface Analysis with XPS and related core-level spectroscopies
Prof Sven Schroeder, University of Leeds, UK

14:40
Vibrational sum-frequency spectroscopy applied to corrosion inhibition
Dr Andrew Thomas, University of Manchester, UK

15:00
A measured approach to organic surfaces
Dr Alex Shard, National Physical Laboratory, UK

15:20
Argon cluster XPS depth profiling of metal oxide thin films
Dr Mark Baker, University of Surrey, UK

15:40
Meeting materials challenges with correlative analysis

Dr Adam Bushell, Thermo Fisher Scientific, UK

16:00
Networking session

16:30
End of meeting

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9 & 10 October 2019, Ricoh Arena, Coventry
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