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Surface Analysis — Innovations and Solutions for Industry

Thursday 11th October 2018 | Ricoh Arena, Coventry, CV6 6GE

Introduction

What is on the surface? What is the composition? 

This meeting is arranged with the intention of improving the knowledge of surface analysis techniques and the awareness and benefits for industry. Surface analysis is of particular importance for examining adhesion, composition, corrosion, coatings, contaminants, semiconductors, structures and tomography.

This meeting addresses all aspects of Surface Analysis with a special focus on challenges currently being addressed and recent improvements in technologies. The meeting will look at methods; XPS, SIMS, AES, AFM and other surface analysis equipment and instrumentation.

Partnering innovations with high tech industry: This meeting will enable delegates to discuss with leading experts what solutions there are to solve their real-world problem. What developments are needed? Emerging ideas…

Programme

10:15
Welcome and Introduction: Mark Baker

Session 1:

10:20
KEYNOTE PRESENTATION
Bridging the pressure and complexity gap with near-ambient pressure XPS and electrospray deposition
Professor James O’Shea, University of Nottingham, UK

10:50
Near-Ambient Pressure XPS: From surfaces to interfaces
Dr Alex Walton, University of Manchester, UK

11:10
Surface phase analysis using XPS
Dr Robert Palgrave, University College London, UK

11:30
Break

11:50
Nexsa XPS/Raman multi-technique instrument
Paul Mack, Fisher Scientific

12:10
A Journey through the Sciences: A multidisciplinary approach to XPS in surface analysis
Dr Mark Walker, University of Warwick, UK

12:30
Poster Session, Exhibition and Lunch Break.
A poster prize will be awarded at 13:30 for the best poster.

Session 2:

14:00
KEYNOTE PRESENTATION
3D OrbiSIMS and applications of SIMS for 2D Materials
Dr Barry Brennan, National Physical Laboratory, UK

14:30
XPS using hard x-rays for materials research
Dr Tien-Lin Lee, Diamond Light Source, UK

14:50
Energy, Images and Clusters: Advances in XPS for industrial applications
Dr David Morgan, Cardiff University, UK

15:10
Concluding comments

15:15
Close of meeting

Poster Prize

A certificate and cheque for up to £100 will also be awarded each day. This prize is sponsored by Leybold.

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9 & 10 October 2019, Ricoh Arena, Coventry
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